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TEAM project UHV preparation CEMS STM UHV MOKE ID18

STM - Scanning Tunneling Microscopy

STM burleigh tip-sample interaction

The STM positions an extremely sharp probe tip within a few atomic diameters of the surface. When STM provides bias voltage between the tip and sample a flow of electrons occurs between the tip and the sample. These electrons tunnel from filled states in the surface to empty states in the tip or, if the polarity of bias is reversed, from filled states in the tip to empty states in the surface.

TIP

- electron clouds

tunneling current

bias

SAMPLE

ADVANTAGES of the METHOD in surface science research

the method enables to investigate for conductive samples:

• topography of surfaces with atomic resolution

• surface electronic structure

• nanostructures on surfaces

• effects of adsorbates on local electronic environment

50nm2 2ML FeO/Pt(111) 500nm2  Fe/W(110)

EXAMPLES of STM IMAGES

Topography image of 2ML FeO/Pt(111) (50x50nm2) taken in constant current mode

Topography image of Fe islands on W(110) (500x500nm2) taken in constant current mode

LINKS:

• our STM in ICSC | • nobelprize.org



 

















































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